Reliability qual plan based on AEC-Q100(FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR INTEGRATED CIRCUITS)
Implement AEC-Q100 items into design phase, verification phase, reliability qualification phase and zero defect screen in MP phase.

AEC-Q006: REVQUALIFICATION REQUIREMENTS FOR COMPONENTS USING COPPER(Cu) WIRE INTERCONNECTIONS
Cu wire package solution of Faraday can meet extended test duration by reliability request of AEC-Q006.
AEC-Q104: FAILURE MECHANISM BASED STRESS TEST QUALIFICATION FOR MULTICHIP MODULES (MCM) IN AUTOMOTIVE APPLICATIONS
Since MCM will be qualified AEC-Q100 by Faraday, to test the completed MCM per AEC-Q104 group H (module specific tests) is enough for CDCQ (Certificate of Design, Construction and Qualification) based on AEC-Q104.
AEC-Q200: STRESS TEST QUALIFICATION FOR PASSIVE COMPONENTS
Faraday use AEC-Q200 qualified passive for automotive ASIC