Testing Program and Test Environment
The testing program and environment for each ASIC prototype are meticulously developed and overseen by a team of experienced engineers at Faraday. During the IP verification stage, Faraday utilizes advanced in-house equipment capable of testing across a broad frequency range from 50 MHz to 4 GHz. This allows for the prompt evaluation of test chips immediately following packaging.
| Technology | Low cost logic |
Digital & mixed signal |
High speed & mixed signal |
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|---|---|---|---|---|---|
| Manufacturer | Kyec | Teradyne | Advantest | Advantest | Advantest |
| Model | E320 | J750EX | 93K-single density | 93K-pinscale | 93K-PS1600 |
| Channel | 512 | 512 | 704 | 512 | 768 |
| Data rate | 100MHz | 200MHz | 400M bps | 3.2Gbps | 8Gbps |
| Pattern depth | 16M | 16M | 14M | 54M | 112M |
At the mass production stage, our certified testing partners execute the testing program according to production documents validated by the customer. The final testing report is rigorously reviewed by Faraday prior to formal release. We offer a range of testing solutions to accommodate varying performance requirements.
Efficient Testing Program and Qualification
To minimize human error, Faraday has developed an automated test program generator that can create customized test programs within half a day. This system allows fully tailored test programs to meet specific customer requirements.
- Interactive Operational Procedure
- Minimal effort with offline test programs completed in approximately 0.5 days
- High reliability of 100% accuracy with no errors across 1,700 test programs developed over the past three years
- Expedited production of the shortest time
Additionally, Faraday has built an automated verification tool to ensure that test programs and results align with input patterns, further enhancing the accuracy and reliability of our testing processes.
Extensive Testing Experiences
- High-speed interfaces
Including USB 2.0/3.0/3.1, PCI-E 1/2/3/4, SATA 1/2/3, LVDS, Sub LVDS, Mini LVDS, CPU, DDR 1/2/3/4/5, RSDS, HDMI, SerDes, V-by-One and Giga Ethernet - DAC/ADC/CODE
High resolution (up to 24bits) and high speed (up to 250MHz) testing, including IQ channel analysis for gain and phase mismatch - Essential components
PWM, regulator, LDO, VDT, OSC, PLL, and etc. - Trimming
Phase/Gain, frequency, transition point and DC - Specialized testing
Including Unite ID flow, Memory BIRA, MLT3 generation, and E-flash
Faraday Testing Services
Faraday is committed to continually enhancing its testing services by investing in advanced resources and keeping strong partnerships with leading test houses.
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